Apogee Semiconductor AF54RHC164 Radiation-Hardened SIPO Shift Register
Apogee Semiconductor AF54RHC164 Radiation-Hardened Serial-In Parallel Out (SIPO) Shift Register is an 8-bit register belonging to the AF54RHC logic family. This register is designed to operate within a 1.65VDC to 5.5VDC supply voltage range with fully redundant input and output stages, delivering excellent radiation resilience. The AF54RHC164 shift register requires serial inputs (A and B) to both be high to register a high input. This shift register supports proprietary cold-sparing capability with zero static power penalty and class 2 ESD protection (4000V HBM and 500V CDM).
The AF54RHC164 shift register includes an internal Power-On Reset (POR) circuit that ensures correct operation at power supply voltages as low as 1.65V. The POR holds the output buffer in tri-state while the supply is ramping and prevents unwanted Direct Current (DC) during cold sparing on input and output pins. This shift register is used in space, medical imaging, and applications that require radiation tolerance.
Features
- Schmitt triggers on inputs for slow-rising signals
- 1.65VDC to 5.5VDC supply voltage range
- Inputs tolerant up to 5.5VDC at any VCC
- Single Event Latchup (SEL) immune to LET of 80MeV-cm2/mg
- 300krad (Si) Total Ionizing Dose (TID)
- 100mA input clamp current
- 100mA continuous output current (per pin)
- Proprietary cold-sparing capability with zero static power penalty
- Built-in triple redundancy for enhanced reliability
- Internal Power-On Reset (POR) circuitry ensures reliable power-up and power-down responses during hot plug and cold-sparing operations
- Class 2 ESD protection (4000V HBM and 500V CDM)
Applications
- Space
- Medical imaging
- LEO constellations
Logic Diagram
Overview
Publié le: 2024-08-28
| Mis à jour le: 2024-09-18