Apogee Semiconductor AP54RHC288 Radiation Hardened Dual-Input Arbiters
Apogee Semiconductor AP54RHC288 Radiation Hardened Dual-Input Arbiters are members of the AP54RHC logic family, operating across a voltage supply range of 1.65V to 5.5V. These two-channel dual-input arbiters deliver high resiliency to Single-Event Effects (SEE) and 30krad (Si) Total Ionizing Dose (TID). The AP54RHC288 arbiters feature an internal Power-On Reset (POR) circuit that ensures reliable power-up and power-down responses during hot plug and cold-sparing operations. These arbiters include a triple-redundant design throughout the circuit, which allows the devices to be immune to Single-Event Transients (SET). The AP54RHC288ALT-R arbiters are flight-A grade, and AP54RHC288ELT-R are evaluation grade. These arbiters are used in Low Earth Orbit (LEO) constellations, small satellites, and medical imaging.The Apogee Semiconductor AP54RHC288 arbiters protect critical applications by ensuring that only one output is high on each channel, regardless of the signal state at the inputs. This functionality is ideal for half-bridge drivers, thrusters, power supplies, and applications where cross-conduction must be avoided. These arbiters are also ideal for space, medical imaging, and applications that require radiation tolerance.
Features
- 1.65VDC to 5.5VDC supply voltage range
- Inputs tolerant up to 5.5VDC at any VCC
- Fabricated in a 180nm CMOS process using proprietary radiation hardening techniques
- 30krad (Si) Total Ionizing Dose (TID) resilience
- Single Event Latchup (SEL) resilient up to LET of 80MeV-cm2/mg
- -55°C to 125°C extended operating temperature range
- Provides logic-level down translation to VCC
- Proprietary cold-sparing capability with zero static power penalty
- Built-in triple redundancy for enhanced reliability
- Class 2 ESD protection (4000V HBM and 500V CDM)
Applications
- Space
- Medical imaging
- Low Earth Orbit (LEO) constellations
- Half-bridge drivers
- Thrusters
- Power supplies
Logic Diagram
Publié le: 2024-08-26
| Mis à jour le: 2025-03-06
